{bottomNav}
MATTER Undergraduate web site

 
  MATTERTEM | Site Map | Help | Contact us | Glossary | About  
 
     

[ Previous ] [ Continue ]

MATTER

 
TEM Basics
     
 

Transmission Electron Microscopy (TEM)

Storyboard:
Peter Goodhew, University of Liverpool
Based on Textbook: Transmission Electron Microscopy - Basics by D.B.Williams and C.B.Carter

Topic Williams and Carter
A. Electron Scattering Sec. 2.6; p26
B. Electron atom interactions Sec 2.11; p30
  • B1. Introduction
  • -
  • B2. Inelastic scattering
  • -
  • B3. X-ray and Auger
  • Sec 4.3C; p58
  • B4. Simulation
  • -
    C. Electron gun  
  • C1. Electron sources
  • Sec 5.3A; p72
  • C2. Gun simulation - introduction
  • Sec 5.3A; p72
  • C3. Gun simulation
  • Sec 5.3A; p72
    D. Diffraction at an aperture Sec. 2.11; p30
    E. Resolution of 2 sources  

    F. Probe size

    Sec 5.5D; p80
    G. Lenses  
  • G1. Electromagnetic lenses
  • Sec 6.3A; p91
  • G2. Thin lens optics
  • Sec 6.2D; p90
  • G3. Condensing optics
  • Sec 6.2D; p90
  • G4. Double condenser lens
  • Sec 9.1; p133
  • G5. First condenser lens
  • Sec 9.1; p 134
  • G6. Second condenser lens
  • Sec 9.1; p 134-5
  • G7. Beam convergence
  • Sec 9.1; p 134-5
  • G8. Condenser aperture
  • Sec 9.1; p 134-5
  • G9. Simulation of condenser system
  • Sec 9.1; p 134-5
  • G10. Objective lens (i)
  • Sec 9.1; p 134-5
  • G11. Objective Aperture
  • Sec 9.1; p 134-5
  • G12. Objective Aperture (ii)
  • Sec 9.1; p 134-5
  • G13. Intermediate lens
  •  
  • G14. Projector lens
  •  
    H. Depth of field and depth of focus Sec 6.7; p102
    I. Scanning/tilting alignment Sec 9.1D; p136
    J. Condenser alignment Sec 9.1D; p137
    K. Condenser astigmatism Sec 9.1E; p138
    L. Dark field Sec 9.3B,C; p142
    M. STEM images Sec 9.4B,C; p145
    N. Astigmatism
    Sec 9.5B; p147-8
    O. Rotations in the TEM Sec 9.6C; p 151
    P. Kikuchi lines Sec 9.7; p151-2

    Design and development:
    David Brook
    Boban Tanovic
    Andrew Green
    Ian Jones

    This is a set of resources designed to accompany an introductory course on transmission electron microscopy. The level is appropriate for students with an understanding of some elementary physics. A list of preferred topics is to be found here. The student who needs an introduction prior to studying Williams and Carter may like to read Electron Microscopy and Analysis by Goodhew, Humphreys and Beanland (3rd Edition 2000).

    Prior knowledge for TEM

     

     
    [ Previous ] [ Continue ]
      Electron-atom interactions | Electron gun | Lenses
     
     

    2000 MATTER, The University of Liverpool. All rights reserved.
        contact us   Last updated: July 25, 2000 commercial information