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Materials Science on CD-ROM User Guide
Image Fundamentals
Version 2.1
Peter Goodhew, University of Liverpool
Abigail Callanan, MATTER
October 1997
General Comments
This module is one of several devoted to microscopy. It particularly treats those
features of imaging systems which are common to all microscopies. No attempt is made to
cover particular microscopes or their image contrast mechanisms, diffraction or analysis.
These topics are covered in companion modules.
Assumed Pre-knowledge
This is an introductory module which assumes little pre-knowledge. It introduces some
of the features which are common to all images, particularly the concept of the pixel.
It would be helpful (but not essential) before embarking on this module, to be familiar
with some kind of microscope (light or electron) and to understand the function of a lens.
It would be better to have some familiarity with the action of a thin lens, the ray
diagrams associated with a convex lens and the concept of the focal length of a lens.
Related MATTER modules which refer to these topics include:
Module Structure
The module contains seven sections;
- Introduction
- Pixels
- Magnification
- Image Recording
- Contrast
- Resolution
- Image Aberrations
Introduction
On this simple page the idea of an object and its (magnified) image is introduced using
a familiar object.
Pixels
In this simulation the relationship between the sizes of the object and image pixels
can be explored. Using a single object the pixel size at the object can be selected from a
list of four values, while the image pixel size can be selected from three. This gives
twelve magnifications, and therefore image sizes. The magnifications range from 40 x
(where only part of the image can be shown but the pixels are very clearly visible) to
0.02 x (at which the image size is just a dot on the screen). The concept that
magnification is simply the ratio of the image and object pixel sizes is introduced, and
should be contrasted with the thin lens optics approach used elsewhere, particularly in
the module Introduction to Electron Microscopes.

Magnification
The idea that magnification is controlled by pixel sizes is reinforced and this section
also emphasises the importance of study at low magnification and introduces the idea of
empty magnification. The image on this page is first viewed at high magnification, with
the image pixels clearly visible. Only when lower magnifications are selected does the
pixel structure disappear and the nature of the object becomes clear.
Image Recording
The important concept animated here is the distinction between serial and parallel
collection of images. The term raster is also introduced and defined via its glossary
entry.
Contrast
The ideas of signal, noise and natural (intrinsic) contrast are introduced here. The
Rose criterion, in the form Smax - S > 5Ö n, is stated and
the user can experiment with the appearance of an image at a variety of natural contrast
levels.
Resolution
The Rayleigh criterion for resolving power is illustrated, using an animated pair of
Airy discs. This needs to be backed up by reference to diffraction through a pinhole or
slit, for instance via the glossary entry defining the Airy rings.

Image aberrations
In this section the main image aberrations are described.
Animated ray diagrams, combined with aberrated images, show the origin and effect of
spherical and chromatic aberrations.
Astigmatism is treated in terms of two plane sections through a lens and the notional
corrections which need to be applied. Finally pincushion and barrel distortion are shown,
applied to the same original image.
Bibliography
For further study the following texts are recommended:
Goodhew, P.J. and Humphreys, F.J., Electron Microscopy and Analysis, 2nd
Edition, Taylor & Francis, 1988 Order!
Williams, D.B. and Carter, C.B., Transmission Electron Microscopy: A Textbook
for Materials Science, Plenum Press 1996
Hirsch, P.B., Howie, A., Nicholson, R.B., Pashley, D.W. and Whelan, M., Electron
Microscopy of Thin Crystals, Butterworths 1965
Thomas, G. and Goringe, M.J., Transmission Electron Microscopy of Materials,
Wiley- Interscience 1979
Goldstein, J.I., Scanning Electron Microscopy and X-ray Microanalysis, Plenum
1981
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